Scanning Electron Microscopes (SEM)

Reservations

photo of JEOL JSM-840A SEMJEOL JSM-840A SEM

Electron Sources: Tungsten Hairpin
Imaging Modes: Secondary Electron, Backscattered Electron Accelerating
Voltages: 1.0-30 kV, 100ev Steps
Working Distances: 8mm, 20mm, and 45mm
Magnifications: 15x - 50,000x
Image Recording:

Orion Digital Capture Interface: Fast and Slow Scan
Polaroid 4" x 5" sheet camera
NTSC Composite video output

EDAX Genesis 2000 Energy Dispersive x-ray microanalysis system

photo of Zeiss Supra 35 VP FEG SEMZeiss Supra 35 VP FEG SEM

Electron Sources: Schottky Field Emission
Imaging Modes: Secondary Electron (SE), Backscattered Electron (QBSD), VPSE, In-lens SE
Accelerating Voltages: 0.1 - 30 kV by 0.01 kV steps
Probe Current: 4 pA to 20nA
Working Distances: 0.1 - 50mm
Magnifications: 12x - 900,000x
Stage: X=125mm, Y=100mm, Z=35mm, T=0 to 90
Image Recording: 512 x 384 to 3072 x 2304 pixels at 16-bit
Bruker Quantax 100 Energy Dispersive x-ray microanalysis system
HKL Channel 5 Electron Backscattered Diffraction System (EBSD)