Transmission Electron Microscopes (TEM)

Reservations

photo of JEOL JEM-2100 Analytical TEM/STEMJEOL JEM-2100 Analytical TEM/STEM

Electron Sources: Lab6
Accelerating Voltages: 70 to 200 kV
Imaging Modes: Brightfield, Darkfield, SAD, STEM, EFTEM
Specimen Stage: Motorized, SEG with ± 75º tilt
Single & Double tilt holders
Magnifications: 500x - 1,500,000X, GIF mag 16X
Detectors:

Gatan Orius SC200D Camera(2K x 2K)
JEOL BF STEM Detector
Gatan HAADF STEM Detector
Gatan GIF Tridiem 863 Post-Column Energy Filter EELS/EFTEM with 2Kx2K UltraScan 1000 FT camera
Bruker Quantax 200 STEM XEDS System

photo of JEOL JEM-1200EX II TEMJEOL JEM-1200EX II TEM

Electron Sources: Tungsten Hairpin & LaB6
Accelerating Voltages: 40 to 120 kV
Imaging Modes: Brightfield, Darkfield, SAD
Specimen Stage: SEG with ± 60º tilt
Magnifications: 50x - 400,000X
Bottom mounted SIA-L9C digital camera (11 megapixels), with MaxIm DL 5 software
Image Recording: 3.25" x 4" sheet film


photo of Zeiss 10C TEMZeiss 10C TEM

Electron Source: Tungsten Hairpin
Accelerating Voltages: 40, 60, 80, and 100 kV
Imaging Modes: Brightfield, Darkfield, SAD, HR SAD
Specimen Stage:

Top entry goniometer
Standard stage ± 60º High tilt stage with foot switch
Rotational stage with foot switch

Magnifications: 1000x - 250,000x
Image Recording:

3.25" x 4" sheet film
70mm roll film
SONY CCD camera, RS-170 composite/non-composite video output